8VD6

Crystal structure of CAP Repeat

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-2
Synchrotron site	NSLS-II
Beamline	17-ID-2
Temperature [K]	100
Detector technology	PIXEL
Collection date	2023-10-13
Detector	DECTRIS EIGER X 16M
Wavelength(s)	0.97934
Spacegroup name	P 1 21 1
Unit cell lengths	21.627, 45.055, 72.111
Unit cell angles	90.00, 91.55, 90.00

Refinement procedure

Resolution	38.210 - 3.700
R-factor	0.2485
Rwork	0.246
R-free	0.28490
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.002
RMSD bond angle	0.545
Data reduction software	XDS
Data scaling software	XSCALE
Phasing software	PHASER
Refinement software	PHENIX (dev_4761)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	72.080	4.050
High resolution limit [Å]	3.700	3.700
Rmerge	0.047	0.093
Number of reflections	1543	359
<I/σ(I)>	11.6	7.6
Completeness [%]	99.8	99.7
Redundancy	2	2
CC(1/2)	0.997	0.974

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP	4	293	0.1 M PCB buffer, pH 4, 25% PEG1500