8U77
Crystal structure of Taf14 in complex with Yng1
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 4.2.2 |
| Synchrotron site | ALS |
| Beamline | 4.2.2 |
| Temperature [K] | 100 |
| Detector technology | CMOS |
| Collection date | 2022-04-08 |
| Detector | RDI CMOS_8M |
| Wavelength(s) | 1 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 46.780, 64.610, 64.490 |
| Unit cell angles | 90.00, 101.53, 90.00 |
Refinement procedure
| Resolution | 45.840 - 1.930 |
| R-factor | 0.1852 |
| Rwork | 0.182 |
| R-free | 0.22090 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.005 |
| RMSD bond angle | 0.820 |
| Data reduction software | iMOSFLM |
| Data scaling software | pointless |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.20.1_4487: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.840 | 2.000 |
| High resolution limit [Å] | 1.930 | 1.930 |
| Rmerge | 0.046 | 0.150 |
| Rmeas | 0.066 | 0.212 |
| Rpim | 0.046 | 0.150 |
| Number of reflections | 28287 | 2781 |
| <I/σ(I)> | 10.92 | 4.36 |
| Completeness [%] | 99.8 | 99.64 |
| Redundancy | 27.2 | 26.2 |
| CC(1/2) | 0.995 | 0.851 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 298 | 40% PEG 400, 0.1 M Tris pH 8.5, 0.2 M LiSO4 |






