8TYU
High-resolution crystal structure of the SPX domain of XPR1 at 1.4 angstroms
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 22-ID |
| Synchrotron site | APS |
| Beamline | 22-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-04-13 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 56.290, 47.798, 71.682 |
| Unit cell angles | 90.00, 107.15, 90.00 |
Refinement procedure
| Resolution | 35.750 - 1.400 |
| R-factor | 0.16243 |
| Rwork | 0.162 |
| R-free | 0.19108 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 1.342 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | REFMAC |
| Refinement software | REFMAC (5.8.0352) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 1.320 |
| High resolution limit [Å] | 1.300 | 3.530 | 1.300 |
| Rmerge | 0.052 | 0.045 | 0.620 |
| Rmeas | 0.057 | 0.049 | 0.690 |
| Rpim | 0.024 | 0.020 | 0.292 |
| Total number of observations | 465906 | ||
| Number of reflections | 87185 | 4550 | 3574 |
| <I/σ(I)> | 12.2 | ||
| Completeness [%] | 97.2 | 97.8 | 80 |
| Redundancy | 5.3 | 5.7 | 3.9 |
| CC(1/2) | 0.992 | 0.990 | 0.876 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 298 | 6% PEG 3350, 30% Ethylene Glycol, 0.1 M Sodium Citrate, 0.1 M MgCl2, pH 6.0. |






