8REI

CTX-M-14 measured via serial crystallography from a silicon HARE-chip.

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2)
Synchrotron site	PETRA III, EMBL c/o DESY
Beamline	P14 (MX2)
Temperature [K]	293
Detector technology	PIXEL
Collection date	2023-04-29
Detector	DECTRIS EIGER X 4M
Wavelength(s)	0.976
Spacegroup name	P 32 2 1
Unit cell lengths	42.150, 42.150, 234.200
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	78.070 - 1.620
R-factor	0.1569
Rwork	0.155
R-free	0.18800
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.010
RMSD bond angle	1.041
Data reduction software	CrystFEL (0.10.2)
Data scaling software	CrystFEL (0.10.2)
Phasing software	PHASER (2.8.3)
Refinement software	PHENIX (1.20.1_4487)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	78.070	1.680
High resolution limit [Å]	1.620	1.620
Number of reflections	31752	2803
<I/σ(I)>	7.48	1.31
Completeness [%]	95.0	87.27
Redundancy	422.6	186.2
CC(1/2)	0.993	0.019

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	BATCH MODE	4.5	293	CTX-M-14 solution (22 mg/ml) was mixed with 45% precipitant solution (40% PEG8000, 200mM lithium sulfate, 100mM sodium acetate, pH 4.5) and with 5% undiluted seed stock in batch crystallization setups Matthews Coefficient: 2.07 Percentage Solvent: 40.54