8OVO
X-ray structure of the SF-iGluSnFR-S72A in complex with L-aspartate
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2021-02-21 |
| Detector | DECTRIS EIGER2 X 16M |
| Wavelength(s) | 1.00008 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 65.760, 77.480, 196.840 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 48.590 - 1.700 |
| R-factor | 0.1918 |
| Rwork | 0.190 |
| R-free | 0.22000 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.898 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 1.800 |
| High resolution limit [Å] | 1.700 | 1.700 |
| Rmerge | 0.036 | 0.607 |
| Number of reflections | 111306 | 17334 |
| <I/σ(I)> | 27.7 | 3.2 |
| Completeness [%] | 99.9 | 100 |
| Redundancy | 7.5 | 7.7 |
| CC(1/2) | 1.000 | 0.873 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 293 | 0.2 M lithium acetate, 21% (m/v) PEG 3350, 20 mM L-aspartate |
