8OMF
Crystal structure of hKHK-C in complex with compound-4
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06DA |
Synchrotron site | SLS |
Beamline | X06DA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-04-16 |
Detector | DECTRIS PILATUS 2M |
Wavelength(s) | 0.999950 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 83.360, 86.890, 137.910 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 60.150 - 2.140 |
R-factor | 0.229 |
Rwork | 0.228 |
R-free | 0.25400 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.060 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | BALBES |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 60.150 | 2.359 |
High resolution limit [Å] | 2.140 | 2.351 |
Rmerge | 0.076 | 1.488 |
Number of reflections | 47967 | 1993 |
<I/σ(I)> | 14.7 | 2.1 |
Completeness [%] | 100.0 | 97.1 |
Redundancy | 6.1 | 6.9 |
CC(1/2) | 1.000 | 0.619 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 277 | 20% PEG 3350 and 0.1 mM BIS-TRIS Propane pH 7.5 |