8KHT
The structure of Rv0097 with substrate
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U1 |
Synchrotron site | SSRF |
Beamline | BL17U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2020-11-08 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.9792 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 56.740, 89.070, 63.510 |
Unit cell angles | 90.00, 90.03, 90.00 |
Refinement procedure
Resolution | 28.370 - 2.050 |
R-factor | 0.2101 |
Rwork | 0.207 |
R-free | 0.26640 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.007 |
RMSD bond angle | 0.941 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | HKL-3000 |
Refinement software | PHENIX (1.13_2998) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 63.510 | 2.100 |
High resolution limit [Å] | 2.050 | 2.050 |
Number of reflections | 39281 | 2822 |
<I/σ(I)> | 17 | |
Completeness [%] | 99.0 | |
Redundancy | 6.6 | |
CC(1/2) | 0.998 | 0.780 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 298 | 0.1 M Tris/HCl (pH 8.5), 20% PEG 8000 |