8JZ2
Crystal structure of AetF in complex with FAD
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSRRC BEAMLINE TPS 05A |
| Synchrotron site | NSRRC |
| Beamline | TPS 05A |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-05-19 |
| Detector | DECTRIS EIGER2 X 9M |
| Wavelength(s) | 0.9998 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 60.475, 74.963, 143.099 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 24.470 - 1.850 |
| R-factor | 0.18024 |
| Rwork | 0.178 |
| R-free | 0.22925 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.532 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0238) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 25.000 | 25.000 | 1.920 |
| High resolution limit [Å] | 1.850 | 3.980 | 1.850 |
| Rmerge | 0.045 | 0.027 | 0.435 |
| Rmeas | 0.051 | 0.031 | 0.484 |
| Rpim | 0.023 | 0.014 | 0.208 |
| Number of reflections | 54003 | 5876 | 4935 |
| <I/σ(I)> | 14.3 | ||
| Completeness [%] | 96.1 | 99.2 | 89.6 |
| Redundancy | 4.5 | 4.6 | 4.5 |
| CC(1/2) | 1.000 | 0.999 | 0.894 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 30% PEG 6000, 0.1 M Tris pH 8.0, 8 mg/mL AetF (5 mM DTT) |






