8JWK
The second purified state crystal structure of AKRtyl
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL18U1 |
Synchrotron site | SSRF |
Beamline | BL18U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2020-11-09 |
Detector | DECTRIS PILATUS3 6M |
Wavelength(s) | 0.97915 |
Spacegroup name | P 43 |
Unit cell lengths | 111.894, 111.894, 563.243 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 35.380 - 2.320 |
R-factor | 0.1833 |
Rwork | 0.181 |
R-free | 0.21720 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.017 |
RMSD bond angle | 1.422 |
Data reduction software | HKL-3000 (7.21) |
Data scaling software | HKL-3000 (7.21) |
Phasing software | PHENIX (1.17.1_3660) |
Refinement software | PHENIX (1.17.1_3660) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.360 |
High resolution limit [Å] | 2.320 | 2.320 |
Rmerge | 0.160 | 0.665 |
Number of reflections | 296368 | 14820 |
<I/σ(I)> | 11.9 | 2 |
Completeness [%] | 100.0 | |
Redundancy | 5.6 | |
CC(1/2) | 0.965 | 0.768 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6 | 293.15 | 22% PEG 400, 0.1M MES |