8JJK
SP1746 in complex with ADP
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL02U1 |
Synchrotron site | SSRF |
Beamline | BL02U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-06-22 |
Detector | DECTRIS PILATUS 200K |
Wavelength(s) | 0.97918 |
Spacegroup name | P 32 2 1 |
Unit cell lengths | 69.744, 69.744, 88.394 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 50.010 - 1.700 |
R-factor | 0.19177 |
Rwork | 0.190 |
R-free | 0.23309 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 1.276 |
Data reduction software | HKL-2000 |
Data scaling software | Aimless |
Phasing software | MOLREP |
Refinement software | REFMAC (5.8.0158) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.010 | 1.730 |
High resolution limit [Å] | 1.700 | 1.700 |
Number of reflections | 27950 | 1439 |
<I/σ(I)> | 10.9 | |
Completeness [%] | 100.0 | |
Redundancy | 20 | |
CC(1/2) | 0.996 | 0.871 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 5.5 | 287.15 | 25% PEG4000, 0.15 M (NH4)2SO4, 0.1 M MES, pH 5.5 |