8EXV
Crystal structure of PI3K-alpha in complex with compound 32
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRL BEAMLINE BL12-2 |
| Synchrotron site | SSRL |
| Beamline | BL12-2 |
| Temperature [K] | 93 |
| Detector technology | PIXEL |
| Collection date | 2015-02-04 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.97950 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 58.720, 133.720, 141.740 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 48.630 - 2.480 |
| R-factor | 0.207 |
| Rwork | 0.205 |
| R-free | 0.25800 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | NULL |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.050 |
| Data reduction software | HKL-2000 |
| Data scaling software | SCALEPACK |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.6) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 2.590 |
| High resolution limit [Å] | 2.480 | 5.380 | 2.500 |
| Rmerge | 0.086 | 0.042 | 0.830 |
| Rmeas | 0.095 | 0.046 | 0.911 |
| Rpim | 0.038 | 0.018 | 0.370 |
| Number of reflections | 38159 | 4221 | 3948 |
| <I/σ(I)> | 8.7 | ||
| Completeness [%] | 95.1 | 98.9 | 99.9 |
| Redundancy | 6.1 | 6.2 | 5.9 |
| CC(1/2) | 0.998 | 0.810 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 6.2 | 291 | 0.1M MES buffer pH 6.2, 16% PEG 20,000, 0.1M KCl |






