8EXV
Crystal structure of PI3K-alpha in complex with compound 32
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRL BEAMLINE BL12-2 |
Synchrotron site | SSRL |
Beamline | BL12-2 |
Temperature [K] | 93 |
Detector technology | PIXEL |
Collection date | 2015-02-04 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.97950 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 58.720, 133.720, 141.740 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 48.630 - 2.480 |
R-factor | 0.207 |
Rwork | 0.205 |
R-free | 0.25800 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | NULL |
RMSD bond length | 0.010 |
RMSD bond angle | 1.050 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | PHASER |
Refinement software | BUSTER (2.11.6) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 50.000 | 50.000 | 2.590 |
High resolution limit [Å] | 2.480 | 5.380 | 2.500 |
Rmerge | 0.086 | 0.042 | 0.830 |
Rmeas | 0.095 | 0.046 | 0.911 |
Rpim | 0.038 | 0.018 | 0.370 |
Number of reflections | 38159 | 4221 | 3948 |
<I/σ(I)> | 8.7 | ||
Completeness [%] | 95.1 | 98.9 | 99.9 |
Redundancy | 6.1 | 6.2 | 5.9 |
CC(1/2) | 0.998 | 0.810 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 6.2 | 291 | 0.1M MES buffer pH 6.2, 16% PEG 20,000, 0.1M KCl |