8ER1
X-ray crystal structure of Tet(X6)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 22-ID |
Synchrotron site | APS |
Beamline | 22-ID |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-06-10 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.0 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 43.767, 52.485, 95.165 |
Unit cell angles | 90.00, 95.88, 90.00 |
Refinement procedure
Resolution | 19.900 - 1.900 |
R-factor | 0.2 |
Rwork | 0.198 |
R-free | 0.23570 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6wg9 |
RMSD bond length | 0.011 |
RMSD bond angle | 1.086 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 19.900 | 1.940 |
High resolution limit [Å] | 1.900 | 1.900 |
Number of reflections | 33653 | 2240 |
<I/σ(I)> | 18.1 | 2.8 |
Completeness [%] | 98.8 | 98 |
Redundancy | 3.5 | |
CC(1/2) | 0.999 | 0.976 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 291 | Sodium thiocyanate, PEG3350 |