8CGX
structure of HEX-1 from N. crassa crystallized in cellulo, diffracted at 100K and resolved using XDS
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P14 (MX2) |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-11-26 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.980 |
| Spacegroup name | P 65 2 2 |
| Unit cell lengths | 57.240, 57.240, 198.190 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 33.030 - 1.850 |
| R-factor | 0.206 |
| Rwork | 0.204 |
| R-free | 0.23320 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.865 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 33.030 | 1.916 |
| High resolution limit [Å] | 1.850 | 1.850 |
| Number of reflections | 33344 | 1639 |
| <I/σ(I)> | 35.15 | |
| Completeness [%] | 99.8 | |
| Redundancy | 4639 | |
| CC(1/2) | 0.999 | 0.939 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | IN CELL | 300 | baculovirus infected and grown in Trichoplusia ni (High Five) cells in adhesion culture (MOI 1) |






