8CGX
structure of HEX-1 from N. crassa crystallized in cellulo, diffracted at 100K and resolved using XDS
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
Synchrotron site | PETRA III, EMBL c/o DESY |
Beamline | P14 (MX2) |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2019-11-26 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.980 |
Spacegroup name | P 65 2 2 |
Unit cell lengths | 57.240, 57.240, 198.190 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 33.030 - 1.850 |
R-factor | 0.206 |
Rwork | 0.204 |
R-free | 0.23320 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.006 |
RMSD bond angle | 0.865 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 33.030 | 1.916 |
High resolution limit [Å] | 1.850 | 1.850 |
Number of reflections | 33344 | 1639 |
<I/σ(I)> | 35.15 | |
Completeness [%] | 99.8 | |
Redundancy | 4639 | |
CC(1/2) | 0.999 | 0.939 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | IN CELL | 300 | baculovirus infected and grown in Trichoplusia ni (High Five) cells in adhesion culture (MOI 1) |