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8BL5

Crystal Structure of Sam0.2

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSLS BEAMLINE X10SA
Synchrotron siteSLS
BeamlineX10SA
Temperature [K]100
Detector technologyPIXEL
Collection date2019-08-23
DetectorDECTRIS EIGER2 X 16M
Wavelength(s)0.9998
Spacegroup nameP 63 2 2
Unit cell lengths77.807, 77.807, 78.164
Unit cell angles90.00, 90.00, 120.00
Refinement procedure
Resolution39.080 - 2.650
Rwork0.257
R-free0.29820
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)computational model
RMSD bond length0.003
RMSD bond angle1.219
Data reduction softwareXDS
Data scaling softwareXDS
Phasing softwareMOLREP
Refinement softwareREFMAC (5.8.0266)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]39.0802.810
High resolution limit [Å]2.6502.650
Rmerge0.0842.947
Number of reflections4411686
<I/σ(I)>31.51.36
Completeness [%]100.0100
Redundancy36.740.09
CC(1/2)1.0000.727
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP29420% w/v PEG3350, 200 mM KSCN

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