8BL5
Crystal Structure of Sam0.2
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-08-23 |
| Detector | DECTRIS EIGER2 X 16M |
| Wavelength(s) | 0.9998 |
| Spacegroup name | P 63 2 2 |
| Unit cell lengths | 77.807, 77.807, 78.164 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 39.080 - 2.650 |
| Rwork | 0.257 |
| R-free | 0.29820 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | computational model |
| RMSD bond length | 0.003 |
| RMSD bond angle | 1.219 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.8.0266) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 39.080 | 2.810 |
| High resolution limit [Å] | 2.650 | 2.650 |
| Rmerge | 0.084 | 2.947 |
| Number of reflections | 4411 | 686 |
| <I/σ(I)> | 31.5 | 1.36 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 36.7 | 40.09 |
| CC(1/2) | 1.000 | 0.727 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 294 | 20% w/v PEG3350, 200 mM KSCN |
