8BL5
Crystal Structure of Sam0.2
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2019-08-23 |
Detector | DECTRIS EIGER2 X 16M |
Wavelength(s) | 0.9998 |
Spacegroup name | P 63 2 2 |
Unit cell lengths | 77.807, 77.807, 78.164 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 39.080 - 2.650 |
Rwork | 0.257 |
R-free | 0.29820 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | computational model |
RMSD bond length | 0.003 |
RMSD bond angle | 1.219 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | MOLREP |
Refinement software | REFMAC (5.8.0266) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 39.080 | 2.810 |
High resolution limit [Å] | 2.650 | 2.650 |
Rmerge | 0.084 | 2.947 |
Number of reflections | 4411 | 686 |
<I/σ(I)> | 31.5 | 1.36 |
Completeness [%] | 100.0 | 100 |
Redundancy | 36.7 | 40.09 |
CC(1/2) | 1.000 | 0.727 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 294 | 20% w/v PEG3350, 200 mM KSCN |