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8BBZ

Crystal Structure of SilF (apo form)

This is a non-PDB format compatible entry.
Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsDIAMOND BEAMLINE I24
Synchrotron siteDiamond
BeamlineI24
Temperature [K]100
Detector technologyPIXEL
Collection date2019-11-22
DetectorDECTRIS PILATUS3 6M
Wavelength(s)0.999
Spacegroup nameP 65 2 2
Unit cell lengths109.470, 109.470, 84.590
Unit cell angles90.00, 90.00, 120.00
Refinement procedure
Resolution47.402 - 2.200
Rwork0.215
R-free0.25960
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)2vb2
RMSD bond length0.010
RMSD bond angle1.558
Data reduction softwareDIALS
Data scaling softwareAimless
Phasing softwarePHASER
Refinement softwareREFMAC (5.8.0267)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]47.4022.279
High resolution limit [Å]2.2002.200
Number of reflections155311502
<I/σ(I)>15.1
Completeness [%]98.9
Redundancy36.9
CC(1/2)1.0000.600
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP2980.01 M Zinc sulphate heptahydrate, 0.1 M MES pH 6.5, 25% v/v PEG 550 MME

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