8AFB
CRYSTAL STRUCTURE OF KRAS-G12C IN COMPLEX WITH COMPOUND 23 (BI-0474)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2017-06-13 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.99998 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 68.675, 40.513, 56.472 |
Unit cell angles | 90.00, 95.67, 90.00 |
Refinement procedure
Resolution | 40.000 - 1.120 |
R-factor | 0.203 |
Rwork | 0.202 |
R-free | 0.22200 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 7U90 |
RMSD bond length | 0.008 |
RMSD bond angle | 0.960 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 56.200 | 1.137 |
High resolution limit [Å] | 1.118 | 1.118 |
Number of reflections | 40307 | 807 |
<I/σ(I)> | 13.3 | |
Completeness [%] | 81.7 | |
Redundancy | 3.2 | |
CC(1/2) | 1.000 | 0.400 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 277 | 10% PEG8000, 10% PEG1000 |