7Z72
Crystal structure of p63 SAM in complex with darpin A5
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-01-29 |
Detector | DECTRIS EIGER2 X 16M |
Wavelength(s) | 0.99987 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 48.453, 43.878, 50.008 |
Unit cell angles | 90.00, 113.32, 90.00 |
Refinement procedure
Resolution | 44.490 - 1.800 |
R-factor | 0.1608 |
Rwork | 0.159 |
R-free | 0.18820 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6s9s 2y9u |
RMSD bond length | 0.014 |
RMSD bond angle | 1.397 |
Data reduction software | XDS |
Data scaling software | Aimless (0.7.4) |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0267) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 45.920 | 45.920 | 1.860 |
High resolution limit [Å] | 1.800 | 6.970 | 1.800 |
Rmerge | 0.090 | 0.031 | 0.802 |
Rmeas | 0.109 | 0.034 | 0.968 |
Rpim | 0.045 | 0.014 | 0.392 |
Number of reflections | 17870 | 340 | 1745 |
<I/σ(I)> | 11.8 | 2 | |
Completeness [%] | 99.0 | 99.5 | 99.6 |
Redundancy | 5.9 | 5.9 | 6 |
CC(1/2) | 0.998 | 0.999 | 0.688 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 3.5 | 293.15 | 25% PEG3350, 0.1 M citrate pH 3.5 |