7XNJ
Stress Response Facilitator A SrfA
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL19U1 |
| Synchrotron site | SSRF |
| Beamline | BL19U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-11-08 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 0.97853 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 36.643, 36.833, 122.462 |
| Unit cell angles | 90.00, 93.29, 90.00 |
Refinement procedure
| Resolution | 40.750 - 2.100 |
| R-factor | 0.1936 |
| Rwork | 0.187 |
| R-free | 0.25230 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.840 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.140 |
| High resolution limit [Å] | 2.100 | 2.100 |
| Rpim | 0.054 | 0.218 |
| Number of reflections | 17025 | 771 |
| <I/σ(I)> | 13.53 | 2.8 |
| Completeness [%] | 88.2 | 80.7 |
| Redundancy | 2.5 | 2.2 |
| CC(1/2) | 0.993 | 0.820 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 289 | 20% PEG3350, 0.2 M Ammonium formate. |
