7TXN
Reduced Structure of RexT
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 21-ID-F |
| Synchrotron site | APS |
| Beamline | 21-ID-F |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2018-12-15 |
| Detector | RAYONIX MX-300 |
| Wavelength(s) | 0.97872 |
| Spacegroup name | P 64 |
| Unit cell lengths | 99.891, 99.891, 36.472 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 33.610 - 1.950 |
| R-factor | 0.1839 |
| Rwork | 0.180 |
| R-free | 0.22180 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 7txo |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.185 |
| Data reduction software | XDS |
| Data scaling software | XDS (1.19.2_4158) |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 33.610 | 2.070 |
| High resolution limit [Å] | 1.950 | 1.950 |
| Rmerge | 0.150 | 1.045 |
| Number of reflections | 15092 | 2118 |
| <I/σ(I)> | 18.44 | |
| Completeness [%] | 97.6 | |
| Redundancy | 13.7 | |
| CC(1/2) | 0.999 | 0.697 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 10 mM MES, pH 6.3, 0.2 M ammonium chloride, 20% v/v PEG3350, 5% v/v glycerol |
