7TXM
Oxidized Structure of RexT
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 21-ID-G |
| Synchrotron site | APS |
| Beamline | 21-ID-G |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2020-11-11 |
| Detector | RAYONIX MX-300 |
| Wavelength(s) | 0.97857 |
| Spacegroup name | P 64 |
| Unit cell lengths | 100.460, 100.460, 36.048 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 32.880 - 2.160 |
| R-factor | 0.2058 |
| Rwork | 0.200 |
| R-free | 0.25580 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 7txo |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.151 |
| Data reduction software | XDS |
| Data scaling software | XDS (1.19.2_4158) |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 32.880 | 2.220 |
| High resolution limit [Å] | 2.160 | 2.160 |
| Rmerge | 0.104 | 1.431 |
| Number of reflections | 11404 | 1145 |
| <I/σ(I)> | 19.44 | |
| Completeness [%] | 99.9 | |
| Redundancy | 12.9 | |
| CC(1/2) | 0.999 | 0.712 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 10 mM MES, pH 6.3, 0.2 M ammonium chloride, 20% v/v PEG3350, 24-32% v/v glycerol, hydrogen peroxide |






