7TUM
Multi-Hit SFX using MHz XFEL sources- first hit
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | EUROPEAN XFEL BEAMLINE SPB/SFX |
Synchrotron site | European XFEL |
Beamline | SPB/SFX |
Temperature [K] | 293 |
Detector technology | PIXEL |
Collection date | 2017-09-14 |
Detector | AGIPD |
Wavelength(s) | 1.3332 |
Spacegroup name | P 43 21 2 |
Unit cell lengths | 79.300, 79.300, 37.730 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 35.489 - 3.202 |
Rwork | 0.314 |
R-free | 0.42620 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6ftr |
RMSD bond length | 0.005 |
RMSD bond angle | 1.447 |
Data reduction software | CrystFEL |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0258) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 35.490 | 3.280 |
High resolution limit [Å] | 3.200 | 3.200 |
Number of reflections | 2072 | 403 |
<I/σ(I)> | 4.36 | |
Completeness [%] | 93.6 | 90.79 |
Redundancy | 4.55 | |
CC(1/2) | 0.412 | 0.638 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 3.5 | 293 | NaCl, ethylene glycol, PEG 3350, acetate buffer pH 3.5 |