7O7U
Crystal structure of rsEGFP2 in the non-fluorescent off-state determined by serial femtosecond crystallography at room temperature
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | FREE ELECTRON LASER |
| Source details | SLAC LCLS BEAMLINE CXI |
| Synchrotron site | SLAC LCLS |
| Beamline | CXI |
| Temperature [K] | 277.15 |
| Detector technology | PIXEL |
| Collection date | 2016-06-24 |
| Detector | CS-PAD CXI-1 |
| Wavelength(s) | 1.362 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 51.740, 63.090, 71.530 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 17.210 - 1.700 |
| R-factor | 0.1813 |
| Rwork | 0.180 |
| R-free | 0.21470 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6t39 |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.728 |
| Data reduction software | CrystFEL (0.6.2) |
| Data scaling software | CrystFEL (0.8.0) |
| Phasing software | PHASER (2.8.3) |
| Refinement software | REFMAC (5.8.0258) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 17.210 | 1.740 |
| High resolution limit [Å] | 1.700 | 1.700 |
| Number of reflections | 27394 | 1810 |
| <I/σ(I)> | 10 | 1.9 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 835 | 548 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | BATCH MODE | 8 | 293 | 100 mM HEPES pH 8.0, 2 M ammonium sulphate |
