7N4W
Complex structure of ROTU4 with rotundine
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.1 |
| Synchrotron site | ALS |
| Beamline | 5.0.1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-11-06 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 0.97741 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 87.880, 50.610, 46.079 |
| Unit cell angles | 90.00, 90.12, 90.00 |
Refinement procedure
| Resolution | 46.080 - 1.640 |
| R-factor | 0.1522 |
| Rwork | 0.151 |
| R-free | 0.17350 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3vvx |
| RMSD bond length | 0.013 |
| RMSD bond angle | 2.246 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHENIX |
| Refinement software | REFMAC (5.8.0258) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 1.760 |
| High resolution limit [Å] | 1.640 | 4.690 | 1.730 |
| Rmerge | 0.060 | 0.035 | 0.285 |
| Rmeas | 0.083 | 0.048 | 0.389 |
| Rpim | 0.056 | 0.032 | 0.263 |
| Number of reflections | 39481 | 2043 | 1999 |
| <I/σ(I)> | 7.8 | ||
| Completeness [%] | 96.0 | 99.1 | 95.1 |
| Redundancy | 1.9 | 1.9 | 1.8 |
| CC(1/2) | 0.994 | 0.830 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 298 | 20% PEG3350, 0.2 M ammonium sulfate, 0.1 M sodium chloride, 0.1 M MES |






