7HTK
PanDDA analysis group deposition -- Crystal Structure of FatA in complex with Z45705015
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I04-1 |
| Synchrotron site | Diamond |
| Beamline | I04-1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-10-10 |
| Detector | DECTRIS EIGER2 XE 9M |
| Wavelength(s) | 0.92124 |
| Spacegroup name | I 2 2 2 |
| Unit cell lengths | 98.640, 98.750, 128.330 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 34.890 - 2.250 |
| R-factor | 0.2785 |
| Rwork | 0.276 |
| R-free | 0.31970 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.860 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.4 (23-JAN-2024)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 69.790 | 2.310 |
| High resolution limit [Å] | 2.250 | 2.250 |
| Rmerge | 0.392 | |
| Rmeas | 0.408 | |
| Rpim | 0.112 | |
| Total number of observations | 391876 | 22215 |
| Number of reflections | 29663 | 1796 |
| <I/σ(I)> | 7.4 | 0 |
| Completeness [%] | 98.6 | |
| Redundancy | 13.2 | 12.4 |
| CC(1/2) | 0.994 | 0.376 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.85 | 293 | 0.1M MES pH 6.85, 1.6M Ammonium sulfate |






