6XXR
ENAH EVH1 in complex with Ac-[2-Cl-F]-PPPPTEDEA-NH2
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | BESSY BEAMLINE 14.1 |
| Synchrotron site | BESSY |
| Beamline | 14.1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-06-12 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 0.9184 |
| Spacegroup name | P 1 |
| Unit cell lengths | 34.740, 43.190, 44.010 |
| Unit cell angles | 61.04, 84.20, 84.21 |
Refinement procedure
| Resolution | 38.440 - 1.480 |
| R-factor | 0.2551 |
| Rwork | 0.246 |
| R-free | 0.26880 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5ncg |
| RMSD bond length | 0.024 |
| RMSD bond angle | 1.665 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.17.1_3660) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 38.440 | 1.590 |
| High resolution limit [Å] | 1.480 | 1.480 |
| Rmeas | 0.221 | |
| Number of reflections | 35565 | 18406 |
| <I/σ(I)> | 3.86 | 0.58 |
| Completeness [%] | 95.7 | 93.5 |
| Redundancy | 3.1 | 2.8 |
| CC(1/2) | 0.984 | 0.376 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 300.15 | 1.932M AmSO4 291mM NaNO3 |






