6XPK
CutR Screw, form 1 with 41.9 angstrom pitch
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-C |
| Synchrotron site | APS |
| Beamline | 24-ID-C |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-10-11 |
| Detector | DECTRIS PILATUS 6M-F |
| Wavelength(s) | 0.9791 |
| Spacegroup name | P 61 |
| Unit cell lengths | 61.830, 61.830, 41.930 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 53.546 - 2.800 |
| Rwork | 0.231 |
| R-free | 0.26690 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6xph |
| RMSD bond length | 0.002 |
| RMSD bond angle | 1.234 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER (2.8.3) |
| Refinement software | REFMAC (5.8.0258) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 53.546 | 53.546 | 2.870 |
| High resolution limit [Å] | 2.800 | 12.510 | 2.800 |
| Rmerge | 0.113 | 0.042 | 0.954 |
| Rmeas | 0.119 | 0.044 | 1.009 |
| Number of reflections | 2305 | 28 | 161 |
| <I/σ(I)> | 15.46 | 40.1 | 2.22 |
| Completeness [%] | 99.4 | 100 | 95.8 |
| Redundancy | 9.512 | 8.571 | 9.379 |
| CC(1/2) | 0.999 | 1.000 | 0.722 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 4.2 | 298 | 10% (w/v) PEG 3000, 200mM sodium chloride and 100 mM sodium phosphate dibasic/Citric acid pH 4.2 |






