6XPJ
CutR flat hexamer, form 2
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-C |
Synchrotron site | APS |
Beamline | 24-ID-C |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2019-12-12 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 0.979300 |
Spacegroup name | P 42 21 2 |
Unit cell lengths | 79.290, 79.290, 100.790 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 62.318 - 1.500 |
Rwork | 0.161 |
R-free | 0.18410 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6xpk |
RMSD bond length | 0.010 |
RMSD bond angle | 1.600 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER (2.8.3) |
Refinement software | REFMAC (5.8.0258) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 62.320 | 62.320 | 1.540 |
High resolution limit [Å] | 1.500 | 6.710 | 1.500 |
Rmerge | 0.059 | 0.044 | 0.855 |
Rmeas | 0.061 | 0.046 | 0.891 |
Number of reflections | 52024 | 688 | 3754 |
<I/σ(I)> | 23.7 | 62.09 | 3.08 |
Completeness [%] | 99.9 | 99.3 | 99.3 |
Redundancy | 12.954 | 11.557 | 12.655 |
CC(1/2) | 0.999 | 0.999 | 0.860 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 10.5 | 298 | 2M ammonium sulfate, 0.2M lithium sulfate and 0.1M CAPS/Sodium hydroxide pH 10.5 |