6XPI
CutR flat hexamer, form 1
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-C |
| Synchrotron site | APS |
| Beamline | 24-ID-C |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-12-12 |
| Detector | DECTRIS PILATUS 6M-F |
| Wavelength(s) | 0.971700 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 135.360, 76.140, 67.810 |
| Unit cell angles | 90.00, 119.72, 90.00 |
Refinement procedure
| Resolution | 63.910 - 2.600 |
| R-factor | 0.2049 |
| Rwork | 0.201 |
| R-free | 0.24170 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6xpk |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.060 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER (2.8.3) |
| Refinement software | BUSTER (2.10.3 (20-MAY-2020)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 63.910 | 63.910 | 2.670 |
| High resolution limit [Å] | 2.600 | 11.630 | 2.600 |
| Rmerge | 0.073 | 0.023 | 1.439 |
| Rmeas | 0.084 | 0.027 | 1.650 |
| Total number of observations | 69528 | ||
| Number of reflections | 17277 | 226 | 1276 |
| <I/σ(I)> | 10.31 | 33.73 | 1.04 |
| Completeness [%] | 92.8 | 96.6 | 94.7 |
| Redundancy | 4.024 | 3.796 | 4.139 |
| CC(1/2) | 0.999 | 1.000 | 0.747 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 5.5 | 298 | 2.0M ammonium sulfate, 0.1M BIS-Tris, pH 5.5 |






