6W9W
R80A PCNA mutant defective in BIR
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 4.2.2 |
| Synchrotron site | ALS |
| Beamline | 4.2.2 |
| Temperature [K] | 100 |
| Detector technology | CMOS |
| Collection date | 2015-10-14 |
| Detector | RDI CMOS_8M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 21 3 |
| Unit cell lengths | 122.078, 122.078, 122.078 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 54.590 - 2.650 |
| R-factor | 0.2156 |
| Rwork | 0.214 |
| R-free | 0.24260 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1plq |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.606 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.5.14) |
| Phasing software | pointless |
| Refinement software | Coot (1.17.1_3660) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 54.595 | 2.720 |
| High resolution limit [Å] | 2.650 | 2.650 |
| Rmerge | 0.119 | 0.113 |
| Rmeas | 0.122 | |
| Rpim | 0.026 | 0.487 |
| Number of reflections | 34129 | 2274 |
| <I/σ(I)> | 27.6 | 1.6 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 21.3 | 21.4 |
| CC(1/2) | 0.999 | 0.528 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 291 | 2.2 M ammonium sulfate, 0.2 M ammonium formate |






