6W1O
RT XFEL structure of the dark-stable state of Photosystem II (0F, S1-rich) at 2.08 Angstrom resolution
This is a non-PDB format compatible entry.
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SLAC LCLS BEAMLINE MFX |
Synchrotron site | SLAC LCLS |
Beamline | MFX |
Temperature [K] | 298 |
Detector technology | CCD |
Collection date | 2018-11-27 |
Detector | RAYONIX MX340-HS |
Wavelength(s) | 1.30183 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 116.920, 221.635, 307.834 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 33.640 - 2.080 |
R-factor | 0.1819 |
Rwork | 0.181 |
R-free | 0.24030 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6dhe |
RMSD bond length | 0.015 |
RMSD bond angle | 1.536 |
Data reduction software | cctbx.xfel |
Phasing software | PHASER |
Refinement software | PHENIX (1.17.1_3660) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 33.640 | 2.120 |
High resolution limit [Å] | 2.080 | 2.080 |
Number of reflections | 474828 | 23014 |
<I/σ(I)> | 13.2 | |
Completeness [%] | 99.8 | |
Redundancy | 89.1 | |
CC(1/2) | 0.980 | 0.054 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 298 | 0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000 |