6RSN
SOSEKI polymerising domain (SOK4 D85A mutant)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I03 |
| Synchrotron site | Diamond |
| Beamline | I03 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-02-15 |
| Detector | DECTRIS PILATUS3 S 6M |
| Wavelength(s) | 0.9795 |
| Spacegroup name | P 61 |
| Unit cell lengths | 47.659, 47.659, 67.971 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 35.280 - 1.700 |
| R-factor | 0.1861 |
| Rwork | 0.185 |
| R-free | 0.21450 |
| Structure solution method | SAD |
| Starting model (for MR) | model |
| RMSD bond length | 0.012 |
| RMSD bond angle | 2.177 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | SHELXCD |
| Refinement software | REFMAC (5.8.0256) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 35.280 | 1.761 |
| High resolution limit [Å] | 1.700 | 1.700 |
| Rmerge | 0.075 | 0.660 |
| Rmeas | 0.077 | 0.677 |
| Rpim | 0.017 | 0.149 |
| Number of reflections | 9612 | 949 |
| <I/σ(I)> | 33.91 | 5.81 |
| Completeness [%] | 99.5 | 99.06 |
| Redundancy | 20 | 20.2 |
| CC(1/2) | 1.000 | 0.935 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 291 | 0.69 M ammonium sulfate, 200 mM NaCl, 100 mM HEPES pH 7.0 |






