6OGX
Ternary complex of OX40R (TNFRSF4) bound to Fab1 and Fab2
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.2 |
| Synchrotron site | ALS |
| Beamline | 5.0.2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2017-05-03 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 1.10505 |
| Spacegroup name | I 2 2 2 |
| Unit cell lengths | 109.765, 125.249, 197.488 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 49.270 - 2.770 |
| R-factor | 0.205 |
| Rwork | 0.203 |
| R-free | 0.25400 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.170 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.5.32) |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.6) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 49.270 | 49.270 | 2.910 |
| High resolution limit [Å] | 2.770 | 9.190 | 2.770 |
| Rmerge | 0.092 | 0.024 | 0.853 |
| Rmeas | 0.099 | 0.026 | 0.923 |
| Rpim | 0.038 | 0.011 | 0.349 |
| Number of reflections | 41615 | 1037 | 4572 |
| <I/σ(I)> | 15.2 | ||
| Completeness [%] | 100.0 | 99.1 | 100 |
| Redundancy | 6.6 | 5.9 | 6.9 |
| CC(1/2) | 0.999 | 0.999 | 0.823 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 293 | 0.1 M Tris pH 8.5, 1.5 M D-L malic acid pH 7.0, 0.15 mM dimethylethylammonium propane sulfate (NDSB-195) |






