6LL5
Crystal structure of KpFtsZ (residues 11-316)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SPRING-8 BEAMLINE BL32XU |
Synchrotron site | SPring-8 |
Beamline | BL32XU |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2018-07-05 |
Detector | DECTRIS EIGER X 9M |
Wavelength(s) | 1.0 |
Spacegroup name | P 1 |
Unit cell lengths | 37.120, 40.930, 44.200 |
Unit cell angles | 89.22, 72.86, 73.44 |
Refinement procedure
Resolution | 42.110 - 1.750 |
R-factor | 0.1814 |
Rwork | 0.179 |
R-free | 0.22170 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 5h5g |
RMSD bond length | 0.007 |
RMSD bond angle | 0.945 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | PHENIX (1.13_2998) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 42.110 | 1.810 |
High resolution limit [Å] | 1.750 | 1.750 |
Number of reflections | 22348 | 1826 |
<I/σ(I)> | 5.41 | |
Completeness [%] | 93.2 | |
Redundancy | 3.4 | |
CC(1/2) | 0.941 | 0.632 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | PCB buffer, PEG 1500 |