6LL5
Crystal structure of KpFtsZ (residues 11-316)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL32XU |
| Synchrotron site | SPring-8 |
| Beamline | BL32XU |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-07-05 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 1 |
| Unit cell lengths | 37.120, 40.930, 44.200 |
| Unit cell angles | 89.22, 72.86, 73.44 |
Refinement procedure
| Resolution | 42.110 - 1.750 |
| R-factor | 0.1814 |
| Rwork | 0.179 |
| R-free | 0.22170 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5h5g |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.945 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.13_2998) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 42.110 | 1.810 |
| High resolution limit [Å] | 1.750 | 1.750 |
| Number of reflections | 22348 | 1826 |
| <I/σ(I)> | 5.41 | |
| Completeness [%] | 93.2 | |
| Redundancy | 3.4 | |
| CC(1/2) | 0.941 | 0.632 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | PCB buffer, PEG 1500 |






