6KSR
Crystal structure of Hexokinase from Eimeria tenella
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL18U1 |
| Synchrotron site | SSRF |
| Beamline | BL18U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-06-28 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.988 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 68.000, 77.050, 105.150 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 45.880 - 1.370 |
| R-factor | 0.1386 |
| Rwork | 0.138 |
| R-free | 0.16060 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5hex |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.956 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | MOLREP |
| Refinement software | PHENIX (1.13_2998) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.880 | 1.410 |
| High resolution limit [Å] | 1.370 | 1.370 |
| Rmerge | 0.051 | 0.753 |
| Rpim | 0.032 | 0.604 |
| Number of reflections | 231302 | 8139 |
| <I/σ(I)> | 16.9 | 1.9 |
| Completeness [%] | 99.4 | |
| Redundancy | 6.3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 2000mM Ammonium sulfate, 100mM Sodium cacodylate/Hydrochloric acid pH 6.5, 200mM Sodium chloride |
