6K4K
Crystal structure of SidJ-CaM binary complex at 2.71 A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U1 |
| Synchrotron site | SSRF |
| Beamline | BL17U1 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2018-12-18 |
| Detector | ADSC QUANTUM 315r |
| Wavelength(s) | 0.97918 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 60.955, 159.533, 135.611 |
| Unit cell angles | 90.00, 101.89, 90.00 |
Refinement procedure
| Resolution | 55.870 - 2.715 |
| R-factor | 0.2061 |
| Rwork | 0.205 |
| R-free | 0.24260 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.011 |
| RMSD bond angle | 0.919 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.11.1_2575) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 132.700 | 2.860 |
| High resolution limit [Å] | 2.710 | 2.710 |
| Rmerge | 0.176 | 1.401 |
| Rpim | 0.061 | |
| Number of reflections | 66303 | 857415 |
| <I/σ(I)> | 2 | |
| Completeness [%] | 97.0 | |
| Redundancy | 12.9 | |
| CC(1/2) | 0.997 | 0.607 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 299 | 20% PEG 3350, 0.2M NaI |
