6HVM
Structural characterization of CdaA-APO
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P14 (MX2) |
| Temperature [K] | 180 |
| Detector technology | PIXEL |
| Collection date | 2017-10-14 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.976200 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 42.486, 64.896, 129.809 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 45.891 - 2.000 |
| R-factor | 0.1878 |
| Rwork | 0.186 |
| R-free | 0.22450 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 45.891 | 50.000 | 2.100 |
| High resolution limit [Å] | 2.000 | 45.891 | 2.000 |
| Rmerge | 0.087 | 1.102 | |
| Rmeas | 0.094 | 1.190 | |
| Number of reflections | 24970 | 1 | 3311 |
| <I/σ(I)> | 16.96 | 3.01 | |
| Completeness [%] | 99.7 | 50 | 98.5 |
| Redundancy | 7.13 | 1 | 7.166 |
| CC(1/2) | 0.999 | 0.772 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293.15 | 3.7 M NaCl, 0.1 M Na-HEPES |
