6HKN
Crystal structure of Compound 35 with ERK5
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2017-04-05 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.99982 |
Spacegroup name | P 41 21 2 |
Unit cell lengths | 92.488, 92.488, 113.585 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 71.720 - 2.330 |
R-factor | 0.2091 |
Rwork | 0.207 |
R-free | 0.24910 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | NONE |
RMSD bond length | 0.007 |
RMSD bond angle | 1.164 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0049) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 71.720 | 2.580 |
High resolution limit [Å] | 2.330 | 2.330 |
Rmerge | 0.051 | 0.446 |
Number of reflections | 21662 | |
<I/σ(I)> | 20.3 | |
Completeness [%] | 99.9 | 99.8 |
Redundancy | 5.5 | 5.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 15% PEG 4000, 100mM MgCl2, 180mM Sodium formate, 100 mM MES pH 6.5, 10mM Tris pH 8.0 |