6HGU
Crystal Structure of an anti-APP-tag Fab
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2006-06-01 |
| Detector | MARMOSAIC 225 mm CCD |
| Wavelength(s) | 0.97880 |
| Spacegroup name | P 1 |
| Unit cell lengths | 61.240, 67.840, 77.860 |
| Unit cell angles | 109.76, 92.36, 115.30 |
Refinement procedure
| Resolution | 15.150 - 1.500 |
| R-factor | 0.188 |
| Rwork | 0.187 |
| R-free | 0.20700 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3ifl |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.100 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.7.1) |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.7) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 35.750 | 35.750 | 1.580 |
| High resolution limit [Å] | 1.500 | 4.750 | 1.500 |
| Rmerge | 0.046 | 0.022 | 0.525 |
| Rmeas | 0.049 | 0.024 | 0.601 |
| Rpim | 0.018 | 0.010 | 0.291 |
| Total number of observations | 1150437 | ||
| Number of reflections | 159668 | 4990 | 22902 |
| <I/σ(I)> | 14.3 | ||
| Completeness [%] | 96.4 | 95.1 | 94.5 |
| Redundancy | 7.2 | 6 | 4.2 |
| CC(1/2) | 0.999 | 0.999 | 0.893 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 292 | 0.1M HEPES, 20% isopropanol, 10% PEG 1,000 |
