6FYP
X-RAY STRUCTURE OF CLK3-KD(GP-[275-632], NON-PHOS.)/CX-4945 AT 2.29A
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-02-12 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.99993 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 91.197, 61.998, 73.328 |
| Unit cell angles | 90.00, 97.10, 90.00 |
Refinement procedure
| Resolution | 19.280 - 2.290 |
| R-factor | 0.2295 |
| Rwork | 0.228 |
| R-free | 0.26660 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3raw |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.174 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.280 | 2.350 |
| High resolution limit [Å] | 2.290 | 2.290 |
| Rmerge | 0.042 | 0.284 |
| Rmeas | 0.050 | 0.360 |
| Number of reflections | 17782 | |
| <I/σ(I)> | 18.4 | 2.7 |
| Completeness [%] | 96.7 | 70.1 |
| Redundancy | 3.3 | 2.3 |
| CC(1/2) | 0.999 | 0.879 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 5.5 | 298 | 25% PEG3350,0.2M Ammonium Sulfate, 0.1M TRIS |
