6FY9

The crystal structure of EncM complex with xenon under 15 bars Xe pressure

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	SLS BEAMLINE X06SA
Synchrotron site	SLS
Beamline	X06SA
Temperature [K]	100
Detector technology	PIXEL
Collection date	2016-11-25
Detector	DECTRIS EIGER X 16M
Wavelength(s)	0.91881
Spacegroup name	I 2 2 2
Unit cell lengths	80.768, 86.790, 132.459
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	44.107 - 3.650
R-factor	0.2506
Rwork	0.249
R-free	0.28040
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	4xlo
RMSD bond length	0.013
RMSD bond angle	2.200
Data reduction software	XDS
Data scaling software	SCALA
Phasing software	PHASER
Refinement software	PHENIX ((1.11rc1_2513: ???))

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.107	3.850
High resolution limit [Å]	3.650	3.650
Rmerge	0.153	0.800
Number of reflections	38691
<I/σ(I)>	7.4
Completeness [%]	99.2
Redundancy	7.2

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP		295	0.1M HEPES-Na, 0.2M Calcium Acetate, 20% PEG 3350, pH 7.5