5Y6R

Crystal structure of CSFV NS5B

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	ALS BEAMLINE 4.2.2
Synchrotron site	ALS
Beamline	4.2.2
Temperature [K]	100
Detector technology	CMOS
Collection date	2015-01-29
Detector	RDI CMOS_8M
Wavelength(s)	0.97776
Spacegroup name	P 43 3 2
Unit cell lengths	229.990, 229.990, 229.990
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	49.034 - 3.010
R-factor	0.20497
Rwork	0.203
R-free	0.23580
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	2cjq
RMSD bond length	0.016
RMSD bond angle	1.961
Data reduction software	HKL-2000
Data scaling software	HKL-2000
Phasing software	PHASER
Refinement software	REFMAC (5.8.0158)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	50.000	3.084
High resolution limit [Å]	3.006	3.006
Number of reflections	41877
<I/σ(I)>	8.74
Completeness [%]	100.0	100
Redundancy	16.7
CC(1/2)		0.929

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP	6.5	293	1M Ammounium Sulfate, 0.1M MES pH6.5