5XDA
Structural basis for Ufm1 recognition by UfSP
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PAL/PLS BEAMLINE 4A |
Synchrotron site | PAL/PLS |
Beamline | 4A |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2010-03-10 |
Detector | ADSC QUANTUM 210 |
Wavelength(s) | 1.0000 |
Spacegroup name | C 2 2 21 |
Unit cell lengths | 267.447, 455.326, 195.558 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 46.165 - 3.285 |
R-factor | 0.207 |
Rwork | 0.207 |
R-free | 0.24320 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 5ejj |
RMSD bond length | 0.003 |
RMSD bond angle | 0.666 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | CNS |
Refinement software | PHENIX (1.8.2_1309) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 3.420 |
High resolution limit [Å] | 3.300 | 3.300 |
Rmerge | 0.114 | |
Number of reflections | 179483 | |
<I/σ(I)> | 0.114 | |
Completeness [%] | 96.6 | |
Redundancy | 4.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 295 | 0.1M Bis-Tris propane, 1M tri-ammonium citrate |