5WKB

MicroED structure of the segment, NFGEFS, from the A315E familial variant of the low complexity domain of TDP-43, residues 312-317

Experimental procedure

Source type	ELECTRON MICROSCOPE
Source details	TECNAI F20 TEM
Temperature [K]	100
Detector technology	CMOS
Collection date	2016-08-26
Detector	TVIPS F416 CMOS CAMERA
Wavelength(s)	0.0251
Spacegroup name	P 21 21 2
Unit cell lengths	42.770, 17.420, 4.900
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	21.390 - 1.000
R-factor	0.2251
Rwork	0.220
R-free	0.26970
Structure solution method	AB INITIO PHASING
RMSD bond length	0.016
RMSD bond angle	1.085
Data reduction software	XDS
Data scaling software	XSCALE
Refinement software	REFMAC

Data quality characteristics

	Overall	Inner shell	Outer shell
Low resolution limit [Å]	21.390	21.390	1.030
High resolution limit [Å]	1.000	4.490	1.000
Rmerge	0.283	0.108	0.993
Rmeas	0.299	0.114	1.085
Total number of observations	18942
Number of reflections	2004	26	110
<I/σ(I)>	4.64	12.27	1.07
Completeness [%]	88.7	74.3	78
Redundancy	9.452	8.462	4.809
CC(1/2)	0.992	0.998

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	Batch	7.5	298	1x PBS, pH 7.5