5WJE

Crystal structure of Naa80 bound to a bisubstrate analogue

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	APS BEAMLINE 23-ID-D
Synchrotron site	APS
Beamline	23-ID-D
Temperature [K]	100
Detector technology	PIXEL
Collection date	2017-03-17
Detector	DECTRIS PILATUS3 6M
Wavelength(s)	1.03319
Spacegroup name	P 21 21 21
Unit cell lengths	37.136, 64.370, 68.589
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	34.294 - 1.765
R-factor	0.1809
Rwork	0.177
R-free	0.21750
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	5wjd
RMSD bond length	0.002
RMSD bond angle	0.641
Data reduction software	HKL-2000
Data scaling software	HKL-2000
Phasing software	PHENIX
Refinement software	PHENIX (1.12_2829)

Data quality characteristics

	Overall	Inner shell	Outer shell
Low resolution limit [Å]	34.294	50.000	1.800
High resolution limit [Å]	1.765	4.800	1.765
Rmerge	0.130	0.065	0.869
Rmeas	0.137	0.068	0.945
Rpim	0.041	0.021	0.360
Number of reflections	16748		1558
<I/σ(I)>	4.7
Completeness [%]	99.0	99.9	80.5
Redundancy	10.5	10	6.4
CC(1/2)		0.998	0.675

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP		293.15	24% polyethylene glycol (PEG) 3350, 0.1 M Bis Tris propane (pH 7.6, pH adjusted with citric acid) and 10 mM NaBr