5TGX
Restriction/modification system-Type II R-SwaI complexed with partially cleaved DNA
Experimental procedure
Experimental method | MAD |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 5.0.2 |
Synchrotron site | ALS |
Beamline | 5.0.2 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2013-12-13 |
Detector | Nonius Kappa CCD |
Wavelength(s) | 0.9794 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 109.856, 57.058, 112.785 |
Unit cell angles | 90.00, 108.22, 90.00 |
Refinement procedure
Resolution | 49.000 - 2.300 |
R-factor | 0.19992 |
Rwork | 0.198 |
R-free | 0.24197 |
Structure solution method | MAD |
RMSD bond length | 0.017 |
RMSD bond angle | 1.928 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0124) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.370 |
High resolution limit [Å] | 2.100 | 2.290 |
Rmerge | 0.127 | 0.851 |
Number of reflections | 53972 | |
<I/σ(I)> | 12.5 | 1.1 |
Completeness [%] | 96.1 | 79.9 |
Redundancy | 6.4 | 4.1 |
CC(1/2) | 0.613 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 298 | 24 - 28% PEG1000, 100 mM TrisHCl, 5 mM CaCl2, |