5SXK
Crystal Structure of PI3Kalpha in complex with fragment 18
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 31-ID |
Synchrotron site | APS |
Beamline | 31-ID |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2015-02-10 |
Detector | RAYONIX MX-225 |
Wavelength(s) | 0.97931 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 113.282, 115.838, 148.999 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 91.450 - 3.550 |
R-factor | 0.1975 |
Rwork | 0.193 |
R-free | 0.27800 |
Structure solution method | FOURIER SYNTHESIS |
Starting model (for MR) | 4ovu |
RMSD bond length | 0.011 |
RMSD bond angle | 1.544 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | REFMAC |
Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 91.450 | 50.000 | 3.610 |
High resolution limit [Å] | 3.550 | 9.610 | 3.550 |
Rmerge | 0.137 | 0.045 | 0.934 |
Number of reflections | 24161 | ||
<I/σ(I)> | 6.4 | ||
Completeness [%] | 99.7 | 94.2 | 99.6 |
Redundancy | 6.4 | 6 | 5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | NaFormate |