5SXB
Crystal Structure of PI3Kalpha in complex with fragment 23
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 5.0.2 |
Synchrotron site | ALS |
Beamline | 5.0.2 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2014-10-17 |
Detector | DECTRIS PILATUS3 S 6M |
Wavelength(s) | 1.0 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 114.463, 116.765, 150.101 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 92.160 - 3.300 |
R-factor | 0.2078 |
Rwork | 0.204 |
R-free | 0.27820 |
Structure solution method | FOURIER SYNTHESIS |
Starting model (for MR) | 4ovu |
RMSD bond length | 0.010 |
RMSD bond angle | 1.498 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | REFMAC |
Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 92.160 | 50.000 | 3.420 |
High resolution limit [Å] | 3.300 | 7.100 | 3.300 |
Rmerge | 0.107 | 0.042 | 0.988 |
Number of reflections | 31023 | ||
<I/σ(I)> | 8.7 | ||
Completeness [%] | 100.0 | 100 | 100 |
Redundancy | 7.3 | 6.7 | 7.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | NaFormate |