5SXA
Crystal Structure of PI3Kalpha in complex with fragment 10
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.2 |
| Synchrotron site | ALS |
| Beamline | 5.0.2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2014-10-17 |
| Detector | DECTRIS PILATUS3 S 6M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 115.225, 117.367, 152.057 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 92.910 - 3.350 |
| R-factor | 0.2245 |
| Rwork | 0.222 |
| R-free | 0.27450 |
| Structure solution method | FOURIER SYNTHESIS |
| Starting model (for MR) | 4ovu |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.332 |
| Data reduction software | HKL-2000 |
| Data scaling software | SCALEPACK |
| Phasing software | REFMAC |
| Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 92.910 | 50.000 | 3.470 |
| High resolution limit [Å] | 3.350 | 7.210 | 3.350 |
| Rmerge | 0.104 | 0.039 | 0.862 |
| Number of reflections | 30528 | ||
| <I/σ(I)> | 8.4 | ||
| Completeness [%] | 100.0 | 100 | 100 |
| Redundancy | 7.3 | 6.6 | 7.4 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | NaFormate |






