5SWR
Crystal Structure of PI3Kalpha in complex with fragments 20 and 26
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | ALS BEAMLINE 5.0.2 |
Synchrotron site | ALS |
Beamline | 5.0.2 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2014-10-17 |
Detector | DECTRIS PILATUS3 S 6M |
Wavelength(s) | 1.0 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 114.236, 116.331, 149.299 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 91.760 - 3.310 |
R-factor | 0.2014 |
Rwork | 0.198 |
R-free | 0.27260 |
Structure solution method | FOURIER SYNTHESIS |
Starting model (for MR) | 4ovu |
RMSD bond length | 0.010 |
RMSD bond angle | 1.449 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | REFMAC |
Refinement software | REFMAC (5.8.0135) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 91.760 | 50.000 | 3.420 |
High resolution limit [Å] | 3.300 | 7.100 | 3.300 |
Rmerge | 0.097 | 0.052 | 0.639 |
Number of reflections | 30235 | ||
<I/σ(I)> | 9.2 | ||
Completeness [%] | 99.7 | 99.6 | 98.8 |
Redundancy | 7.2 | 6.8 | 6.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7 | 298 | NaFormate |