5RJX
PanDDA analysis group deposition -- Crystal Structure of PHIP in complex with Z285782452
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I03 |
| Synchrotron site | Diamond |
| Beamline | I03 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-07-20 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.97622 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 81.766, 27.541, 55.969 |
| Unit cell angles | 90.00, 100.18, 90.00 |
Refinement procedure
| Resolution | 55.090 - 1.291 |
| R-factor | 0.1939 |
| Rwork | 0.193 |
| R-free | 0.21540 |
| Structure solution method | FOURIER SYNTHESIS |
| Starting model (for MR) | 3mb3 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 0.880 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | REFMAC |
| Refinement software | BUSTER (2.10.3 (29-NOV-2019)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 35.631 | 35.631 | 1.356 |
| High resolution limit [Å] | 1.297 | 3.760 | 1.297 |
| Rmeas | 0.036 | 0.030 | 0.380 |
| Rpim | 0.014 | 0.012 | 0.203 |
| Total number of observations | 153902 | 8071 | 4246 |
| Number of reflections | 26189 | ||
| <I/σ(I)> | 24.7 | 60 | 2.2 |
| Completeness [%] | 86.8 | 97 | 36.1 |
| Redundancy | 5.9 | 6.2 | 3.2 |
| CC(1/2) | 0.999 | 0.999 | 0.955 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 5.6 | 277 | 20% PEG 8000, 0.04M potassium phosphate |






